DEPENDENCE OF WAVELENGTH CONTROL ON DIELECTRIC STRUCTURE FOR VERTICAL-CAVITY SURFACE-EMITTING LASERS

Authors
Citation
Dl. Huffaker, DEPENDENCE OF WAVELENGTH CONTROL ON DIELECTRIC STRUCTURE FOR VERTICAL-CAVITY SURFACE-EMITTING LASERS, Journal of applied physics, 81(3), 1997, pp. 1598-1600
Citations number
12
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
81
Issue
3
Year of publication
1997
Pages
1598 - 1600
Database
ISI
SICI code
0021-8979(1997)81:3<1598:DOWCOD>2.0.ZU;2-W
Abstract
Calculated data are presented that compare the control of the lasing w avelength for different dielectric vertical-cavity surface-emitting la sers that use a GaAs tuning layer of variable thickness to control the longitudinal cavity resonance. The advantages of high-contrast Bragg reflectors and a half-wave cavity spacer thickness become obvious in a chieving both a wide tuning range and minimizing reflectivity changes. (C) 1997 American Institute of Physics.