X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY STUDIES ON AG-CU-SE SYSTEM

Citation
Sn. Mostafa et al., X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY STUDIES ON AG-CU-SE SYSTEM, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 11(1), 1995, pp. 53-55
Citations number
18
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
ISSN journal
10050302
Volume
11
Issue
1
Year of publication
1995
Pages
53 - 55
Database
ISI
SICI code
1005-0302(1995)11:1<53:XAESOA>2.0.ZU;2-F
Abstract
A number of X-ray patterns and electrical conductivities of five diffe rent samples of Ag-Cu-Se system have been measured. These samples of A g-Cu-Se system: (Ag-1.188, Cu-0.812)Se; (Ag, Cu)Se; (Ag-0.9, Cu-1.1)Se ; (Ag-0.8, Cu-1.2)Se and (Ag-0.6, Cu-1.4)Se were prepared under contro lled conditions. Analysis of the experimental data shows that Frenkel defects are predominated in (Ag-1.188, Cu-0.812)Se and Schottky defect s prevailing in the other samples. The activation energy values Delta E calculated from the linear behaviour of electrical conductivity cr w ith temperature (0 - 90 degrees C) reveal that the impurity content in creases in the direction of (Ag,Cu)Sei(Ag-0.8, Cu-1.2)Se.