Sn. Mostafa et al., X-RAY-DIFFRACTION AND ELECTRICAL-CONDUCTIVITY STUDIES ON AG-CU-SE SYSTEM, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 11(1), 1995, pp. 53-55
Citations number
18
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
A number of X-ray patterns and electrical conductivities of five diffe
rent samples of Ag-Cu-Se system have been measured. These samples of A
g-Cu-Se system: (Ag-1.188, Cu-0.812)Se; (Ag, Cu)Se; (Ag-0.9, Cu-1.1)Se
; (Ag-0.8, Cu-1.2)Se and (Ag-0.6, Cu-1.4)Se were prepared under contro
lled conditions. Analysis of the experimental data shows that Frenkel
defects are predominated in (Ag-1.188, Cu-0.812)Se and Schottky defect
s prevailing in the other samples. The activation energy values Delta
E calculated from the linear behaviour of electrical conductivity cr w
ith temperature (0 - 90 degrees C) reveal that the impurity content in
creases in the direction of (Ag,Cu)Sei(Ag-0.8, Cu-1.2)Se.