AN X-RAY-DIFFRACTION STUDY OF MICROSTRUCT URAL AND MECHANICAL STATE OF SUPERCONDUCTING YBCO THIN-FILM

Mechanical and microstructural analysis in a 100 nm thin film is prese nted in this study. Using X-ray diffraction with a tensorial approach, we have determined stresses, strains, stress-free lattice parameters, microdistorsions and diffracting coherent domains size. Stress-free l attice parameters are higher than the hulk values. A high value of str esses is explained as a combination of coherent stresses, thermal stre sses and intrinsic ones. Diffraction peaks line profiles analysis sugg ests grain boundaries presence as well as high lattice elastic microdi storsions.