TURNING WAVES AND CRUSTAL REFLECTION PROFILING

Citation
R. Stadtlander et L. Brown, TURNING WAVES AND CRUSTAL REFLECTION PROFILING, Geophysics, 62(1), 1997, pp. 335-341
Citations number
9
Categorie Soggetti
Geochemitry & Geophysics
Journal title
ISSN journal
00168033
Volume
62
Issue
1
Year of publication
1997
Pages
335 - 341
Database
ISI
SICI code
0016-8033(1997)62:1<335:TWACRP>2.0.ZU;2-B
Abstract
In the past, steeply dipping features were often recognized on seismic reflection profiles only from indirect evidence such as vertical offs ets of cross-cutting structures. New imaging algorithms, as for exampl e, turning wave migration have had dramatic success in delineating ste ep, even-overturned reflectors in sedimentary environments. Evaluation of the applicability of this technology to deep seismic recordings in dicates that steep-dip and turning wave migration will have limited pr acticality, generally, in the imaging of basement features because of the weak velocity gradients involved and the corollary requirement for large recording offsets. A potential exception arises when the baseme nt structures to be imaged lie beneath a significant thickness of rela tively young (i.e., steep velocity gradient) sedimentary cover.