QUANTUM-WELL INTERMIXING FOR OPTOELECTRONIC INTEGRATION USING HIGH-ENERGY ION-IMPLANTATION

Citation
S. Charbonneau et al., QUANTUM-WELL INTERMIXING FOR OPTOELECTRONIC INTEGRATION USING HIGH-ENERGY ION-IMPLANTATION, Journal of applied physics, 78(6), 1995, pp. 3697-3705
Citations number
46
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
6
Year of publication
1995
Pages
3697 - 3705
Database
ISI
SICI code
0021-8979(1995)78:6<3697:QIFOIU>2.0.ZU;2-E
Abstract
The technique of ion-induced quantum-well (QW) intermixing using broad area, high energy (2-8 MeV As4+) ion implantation has been studied in a graded-index separate confinement heterostructure InGaAs/GaAs QW la ser. This approach offers the prospect of a powerful and relatively si mple fabrication technique for integrating optoelectronic devices. Par ameters controlling the ion-induced QW intermixing, such as ion doses, fluxes, and energies, post-implantation annealing time, and temperatu re are investigated and optimized using optical characterization techn iques such as photoluminescence, photoluminescence excitation, and abs orption spectroscopy. (C) 1995 American Institute of Physics.