MODULATION OF EXCITONIC REFLECTANCE AT GAAS GAAS INTERFACES/

Citation
Ab. Novikov et al., MODULATION OF EXCITONIC REFLECTANCE AT GAAS GAAS INTERFACES/, Journal of applied physics, 78(6), 1995, pp. 4011-4014
Citations number
16
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00218979
Volume
78
Issue
6
Year of publication
1995
Pages
4011 - 4014
Database
ISI
SICI code
0021-8979(1995)78:6<4011:MOERAG>2.0.ZU;2-1
Abstract
We have studied photoreflectance (PR) and reflectance spectra of undop ed molecular-beam-epitaxy GaAs films on semi-insulating GaAs substrate s at low temperature. In the PR spectra a sharp structure near the ban d-gap energy was observed which is sensitive to pump and probe light i ntensity. The origin of this structure was investigated by combining t ime-resolved and depth-resolved measurements. It is shown that the sha rp PR structure arises from the superposition of a fast and a slow com ponent of the modulated spectra. The slow PR signal originates from th e epilayer-substrate interface. Both components are attributed to the modulation of exitonic transitions centered at slightly different ener gies. (C) 1995 American Institute of Physics.