A theoretical analysis of the base transit time in npn GaN/InGaN heter
ojunction bipolar transistor has been performed. For the analysis the
effect of band-gap narrowing, carrier degeneracy, and compositional gr
ading of the base region has been considered. The analysis demonstrate
s that a nonuniform doping in the base region with a higher value at t
he emitter edge and a lower value at the collector edge together with
a compositional grading is necessary for minimizing the base transit t
ime. (C) 1995 American Institute of Physics.