SURFACE LAYERING IN LIQUID GALLIUM - AN X-RAY REFLECTIVITY STUDY

Citation
Mj. Regan et al., SURFACE LAYERING IN LIQUID GALLIUM - AN X-RAY REFLECTIVITY STUDY, Physical review letters, 75(13), 1995, pp. 2498-2501
Citations number
26
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
75
Issue
13
Year of publication
1995
Pages
2498 - 2501
Database
ISI
SICI code
0031-9007(1995)75:13<2498:SLILG->2.0.ZU;2-1
Abstract
Surface-induced atomic layering in liquid gallium has been observed us ing x-ray reflectivity, ultrahigh vacuum conditions, and sputtered cle an surfaces. Reflectivity data, collected on a supercooled liquid samp le to momentum transfers as large as q(z) = 3.0 Angstrom(-1), exhibit a strong maximum near 2.4 Angstrom(-1) indicating a layer spacing that is comparable to its atomic dimensions. The amplitude of the electron density oscillations decays with a characteristic length of 6 Angstro m. This is unexpectedly twice that of recent results for Hg, and the d ifference may be related to covalent bonding or supercooling.