Dislocations in Hg-1-x CdxTe (x: approximate to 0.2) single crystals h
ave been introduced either by plastic deformation or by Al-implantatio
n at high dose. Structural analysis of implanted samples, using Huang'
s method shows that dislocation loops are mainly of interstitial type
with a radius of about 2.6 nm. Electrical properties of uniaxially def
ormed samples, using Hall effect, indicate the presence of both accept
or-like type dislocations along with donor-type point defects.