This letter is on the observation of anisotropic electrical transport
and magnetoresistance (MR) in rf sputtered thin films of La0.62Bi0.05C
a0.33MnO3 on Si. Films sputtered on (111)Si are polycrystalline, where
as textured films with (110) orientation are obtained from (100) Si. B
oth films show a reduction in the lattice constant and relatively high
Curie temperatures (262-266 K vs 230 K for bulk polycrystals). Althou
gh the films have identical magnetic parameters, resistivity rho and M
R data for the (110) textured films show the following features indica
tive of possible dependence of magneto transport on crystallographic o
rientation: (i) a two order of magnitude enhancement in the low temper
ature rho value compared to polycrystalline films, (ii) a semiconducto
rlike electrical conduction and the absence of any metallic to semicon
ductor transition, and (iii) a relatively large MR, as high as 80% at
40 kOe. (C) 1997 American Institute of Physics.