PARAMETER-ESTIMATION OF FREQUENCY-DEPENDENT SCATTERERS USING SUPERRESOLUTION TECHNIQUES

Authors
ODENDAAL JW VANJAARSVELD PA
Citation
Jw. Odendaal et Pa. Vanjaarsveld, PARAMETER-ESTIMATION OF FREQUENCY-DEPENDENT SCATTERERS USING SUPERRESOLUTION TECHNIQUES, Microwave and optical technology letters, 10(2), 1995, pp. 71-74
Citations number
NO
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Microwave and optical technology letters → ACNP
ISSN journal
08952477
Volume
10
Issue
2
Year of publication
1995
Pages
71 - 74
Database
ISI
SICI code
0895-2477(1995)10:2<71:POFSUS>2.0.ZU;2-5
Abstract
A technique to estimate the frequency dependence of electromagnetic sc attering centers is proposed. The technique employs a superresolution algorithm to estimate poles corresponding to the various scattering ce nters contributing to the total backscattered field. A relationship be tween the amplitudes of the estimated poles and the frequency dependen ce of the scatterers is derived. The technique is applied to estimate the frequency dependence of simulated and measured backscattered field data. (C) 1995 John Wiley & Sons, Inc.