FAST ITERATIVE ALGORITHM FOR THE FINE DETAIL ANALYSIS OF PLANAR SCATTERERS

Authors
FINKELSTEIN B KASTNER R
Citation
B. Finkelstein et R. Kastner, FAST ITERATIVE ALGORITHM FOR THE FINE DETAIL ANALYSIS OF PLANAR SCATTERERS, Microwave and optical technology letters, 10(2), 1995, pp. 94-100
Citations number
NO
Categorie Soggetti
Optics,"Engineering, Eletrical & Electronic
Journal title
Microwave and optical technology letters → ACNP
ISSN journal
08952477
Volume
10
Issue
2
Year of publication
1995
Pages
94 - 100
Database
ISI
SICI code
0895-2477(1995)10:2<94:FIAFTF>2.0.ZU;2-Y
Abstract
A very efficient iterative algorithm is presented for the analysis of planar scatterers at the very fine detail regime. The mechanisms causi ng slow convergence in other techniques have been identified and corre cted. The resultant algorithm converges very fast for problems with fi ne details sampled faster than 0.001 lambda, where other methods fail. (C) 1995 John Wiley & Sons, Inc.