DUAL-OPTICAL-MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY

Citation
Pk. Wei et al., DUAL-OPTICAL-MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY, Applied optics, 35(34), 1996, pp. 6727-6731
Citations number
14
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
35
Issue
34
Year of publication
1996
Pages
6727 - 6731
Database
ISI
SICI code
0003-6935(1996)35:34<6727:DNSOM>2.0.ZU;2-H
Abstract
The simultaneous operation of near-field scanning optical microscopy ( NSOM) in reflection and transmission modes is demonstrated. In the tra nsmission mode, a low-noise, large-area silicon photodetector was moun ted between the piezoelectric transducer scanning stage and the sample . In the reflection mode, either a photomultiplier tube or two large-a rea silicon detectors was used for signal collection. The reflection-m ode setup consisting of two silicon detectors provides a large numeric al aperture of 0.9 as well as symmetrical detection of emitting photon s. The dielectric thin films and the light-emitting polymers were used to demonstrate the capability of these two modes of NSOM. A compariso n between these two different setups is also presented. (C) 1996 Optic al Society of America