DOUBLE-LAYER RELAXATION AT ROUGH ELECTRODES

Citation
Ae. Larsen et al., DOUBLE-LAYER RELAXATION AT ROUGH ELECTRODES, Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics, 52(3), 1995, pp. 2161-2164
Citations number
31
Categorie Soggetti
Physycs, Mathematical","Phsycs, Fluid & Plasmas
ISSN journal
1063651X
Volume
52
Issue
3
Year of publication
1995
Part
A
Pages
2161 - 2164
Database
ISI
SICI code
1063-651X(1995)52:3<2161:DRARE>2.0.ZU;2-X
Abstract
We describe measurements of the complex admittance of the interface be tween electrodeposited fractal electrodes and electrolytic solutions o ver the frequency range 100 Hz to 100 kHz. Settling with a single size -dependent frequency collapses these data onto a universal curve. This scaling collapse provides quantitative support for the Halsey-Leibig theory for constant phase angle behavior and a technique for measuring the multifractal descriptors D-f and tau(2) for such electrodes. [D-f is the rough electrode's fractal dimension, and the multifractal expo nent tau(2) is the correlation dimension of the surface's harmonic mea sure.]