DETECTION OF TRANSMUTATIONAL ELEMENTS IN COPPER BY MEANS OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING SYNCHROTRON-RADIATION

Authors
HEGEDUS F WOBRAUSCHEK P STRELI C WINKLER P RIEDER R LADISICH W VICTORIA M RYON RW SOMMER WF
Citation
F. Hegedus et al., DETECTION OF TRANSMUTATIONAL ELEMENTS IN COPPER BY MEANS OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING SYNCHROTRON-RADIATION, X-ray spectrometry, 24(5), 1995, pp. 253-254
Citations number
1
Categorie Soggetti
Spectroscopy
Journal title
X-ray spectrometry → ACNP
ISSN journal
00498246
Volume
24
Issue
5
Year of publication
1995
Pages
253 - 254
Database
ISI
SICI code
0049-8246(1995)24:5<253:DOTEIC>2.0.ZU;2-Q
Abstract
High-purity copper samples were irradiated with high-energy protons an d neutrons, The concentration of transmutational elements was measured by means of the total reflection x-ray fluorescence method using sync hrotron radiation, The spectra of non-irradiated samples were substrac ted from the spectra of the irradiated samples, By this evaluation met hod, the minimum detectable concentration was as low as 1.5 mu g g(-1) in a copper matrix.