IN-SITU IMAGING RAMAN-SPECTROSCOPY OF ELECTROCHEMICALLY DEPOSITED CUSCN

Citation
Sm. Haight et Dt. Schwartz, IN-SITU IMAGING RAMAN-SPECTROSCOPY OF ELECTROCHEMICALLY DEPOSITED CUSCN, Journal of the Electrochemical Society, 142(9), 1995, pp. 156-158
Citations number
20
Categorie Soggetti
Electrochemistry
ISSN journal
00134651
Volume
142
Issue
9
Year of publication
1995
Pages
156 - 158
Database
ISI
SICI code
0013-4651(1995)142:9<156:IIROED>2.0.ZU;2-D
Abstract
Imaging Raman spectroscopy is explored as a new tool for in situ studi es of electrochemical systems. The technique provides a spatially reso lved View of molecular species present along a focused laser line. The capabilities of our system are demonstrated using an electrodeposited thin film of CuSCN plated on a cylindrical platinum electrode. It is shown that line-imaging Raman spectroscopy is able to measure the prop erties of the thin film deposit while simultaneously monitoring the co ncentration of solution species within approximate to 1 mm of the surf ace. The Raman image presented here has a spatial resolution of approx imate to 6 mu m and a spectral resolution of 24 cm(-1), though neither constitutes resolution limits of the instrument.