CHARACTERIZATION OF EPITAXIAL A AXIS AND C-AXIS ORIENTED YBA2CU3O7-X THIN-FILMS - EFFECT OF UNIAXIAL STRESSES

Citation
S. Sanfilippo et al., CHARACTERIZATION OF EPITAXIAL A AXIS AND C-AXIS ORIENTED YBA2CU3O7-X THIN-FILMS - EFFECT OF UNIAXIAL STRESSES, Solid state communications, 96(6), 1995, pp. 391-396
Citations number
18
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
96
Issue
6
Year of publication
1995
Pages
391 - 396
Database
ISI
SICI code
0038-1098(1995)96:6<391:COEAAA>2.0.ZU;2-6
Abstract
The effects of uniaxial stresses on c axis as well as a axis oriented thin films of YBa2 Cu3O7 (-) (x) have been investigated. We show that the effects depend strongly on the microstructure. Thus the a axis ori ented films exhibit non monotonous uniaxial pressure effects. On the c ontrary, c axis oriented films show reversible effects. Our results ar e compared with those previously published.