DESIGN AND PERFORMANCE OF A HIGH-TEMPERATURE, HIGH-SPEED SCANNING TUNNELING MICROSCOPE

This article describes the design and performance of a new scanning tu nneling microscope (STM) which operates at elevated temperatures and h igh scanning speeds. To minimize the thermal displacements within the STM, a symmetric configuration was chosen with a large temperature gra dient between the sample and the piezoelectric scanner. The thermal be havior of the STM was optimized further by means of a finite element a nalysis. The high scan rates (10(5) data points/s) are accomplished wi th fast analogue electronics and a combination of a workstation and th ree transputers. The STM has imaged surfaces with atomic resolution be tween room temperature and 750 K, with low residual drifts only two ho urs after a major temperature change. The sample surface remains withi n the vertical range of the piezo actuator over a temperature interval of 159 K. (C) 1995 American Institute of Physics.