A STATISTICAL TECHNIQUE FOR CHARACTERIZING X-RAY POSITION-SENSITIVE DETECTORS

We present a technique for characterizing X-ray sensitive photodiode a rrays and charge-coupled device (CCD) arrays. The technique uses simpl e statistical estimators (means, variances and correlation functions) to determine the response, noise, resolution and detective quantum eff iciency of a position-sensitive detector. We apply this technique by c haracterizing a linear diode array and a CCD array exposed to direct i llumination by X-rays. Correlations between neighboring pixels were im portant, and they are included in the calculation of the detective qua ntum efficiency and noise of the detector.