W. Meyer et R. Camposano, ACTIVE TIMING MULTILEVEL FAULT-SIMULATION WITH SWITCH-LEVEL ACCURACY, IEEE transactions on computer-aided design of integrated circuits and systems, 14(10), 1995, pp. 1241-1256
This paper describes SATISFAULT, a new hierarchical multilevel fault s
imulator with switch-level fault models and switch-level accuracy. SAT
ISFAULT's intelligent scheduling mechanism switches between the abstra
ction levels to force simulation at the highest, thus fastest, possibl
e level of abstraction without losing switch-level accuracy, The simul
ation algorithm is based on single fault-propagation for active faults
, It deals with multiple abstraction levels and supports the inertial
delay model, As a result, even large circuits may be fault-simulated a
ccurately with all faults injected at the switch-level, Complete fault
-simulation of all transistors stuck-on and stuck-open of circuits up
to 105 000 transistors including faults inside flip-flops is possible
in reasonable time. In addition, SATISFAULT is also capable to simulat
e bridging faults for IddQ detectability.