REVIEW OF METHODS FOR CALCULATING NEAR-EDGE STRUCTURE

Citation
P. Rez et al., REVIEW OF METHODS FOR CALCULATING NEAR-EDGE STRUCTURE, Ultramicroscopy, 59(1-4), 1995, pp. 159-167
Citations number
28
Categorie Soggetti
Microscopy
Journal title
ISSN journal
03043991
Volume
59
Issue
1-4
Year of publication
1995
Pages
159 - 167
Database
ISI
SICI code
0304-3991(1995)59:1-4<159:ROMFCN>2.0.ZU;2-I
Abstract
Electron energy loss inner shell near edge structures within about 30 eV of threshold can give information on charge redistribution, conduct ion band changes, coordination and structure changes on a local scale. A theoretical understanding is necessary to go beyond empirical rules based on fingerprinting. All approaches to near edge structure calcul ation in solids are derived from various band theory methods with vary ing degrees of approximation. There is a place for theories based on s imple physical ideas as well as large sophisticated calculations. In m any oxides estimates of the number of peaks and their positions can be based on an extension of single scattering EXAFS theory to include st rong second order intrashell scattering. These effects will be illustr ated in MgO and NiO. In other cases it is necessary to use band struct ure calculations to give either projected densities of states or wave functions from which matrix elements can be calculated directly. Examp les of this approach will show results of calculations for Si, diamond and SiC using the Cambridge plane wave pseudopotential code (CASTEP).