Lb. Hong et al., THE DEBYE TEMPERATURE OF NANOCRYSTALLINE BETA-SN MEASURED BY X-RAY-DIFFRACTION, Journal of materials research, 10(10), 1995, pp. 2408-2410
A nanocrystalline beta-Sn film of 7 nm average grain size was prepared
by inert gas condensation followed by ballistic consolidation, and wa
s investigated by x-ray diffractometry at temperatures of 77 and 293 K
. Although Sn normally undergoes a beta --> alpha phase transformation
at 286 K, this transformation was suppressed in the nanocrystalline f
ilm. Compared with large-grained beta-Sn, a larger Debye-WaIler factor
and a lower Debye temperature were measured for nanocrystalline beta-
Sn; H-D = 133 K for nanocrystalline material while H-D = 161 K for lar
ge-grained material. The lower Debye temperature of the nanocrystallin
e beta-Sn indicates that its vibrational entropy is increased by 0.6 k
(B)/atom with respect to large-grained material.