EVIDENCE OF 2 KINDS OF ACCEPTORS IN UNDOPED SEMIINSULATING GAAS - POSITRON TRAPPING AT GALLIUM VACANCIES AND NEGATIVE-IONS

Citation
C. Leberre et al., EVIDENCE OF 2 KINDS OF ACCEPTORS IN UNDOPED SEMIINSULATING GAAS - POSITRON TRAPPING AT GALLIUM VACANCIES AND NEGATIVE-IONS, Physical review. B, Condensed matter, 52(11), 1995, pp. 8112-8120
Citations number
19
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
11
Year of publication
1995
Pages
8112 - 8120
Database
ISI
SICI code
0163-1829(1995)52:11<8112:EO2KOA>2.0.ZU;2-A
Abstract
Positron-lifetime experiments have been performed in Zn-doped p-type a nd undoped semi-insulating GaAs in the temperature range 20-300 K to i nvestigate native point defects. In p-type materials with hole concent rations of 10(15)-10(19) cm(-3), no evidence of positron trapping is o bserved. The temperature dependence of the positron lifetime can be ex plained in terms of lattice expansion associated with positron-phonon coupling. Therefore, we ascribe it to delocalized positrons. In semi-i nsulating GaAs, two kinds of accepters are detected with concentration s in the range 10(15)-10(17) cm(-3): gallium vacancies and negative io ns. The temperature dependence of the positron trapping at the Ga vaca ncy exhibits a slope break at about 130 K. A weakly bound Rydberg-like precursor state is invoked to explain this temperature dependence.