The adsorption of oxygen on NiAl at 300 K and 20 K has been studied by
means of high resolution electron energy loss spectroscopy (EELS), lo
w energy electron diffraction (LEED) and Auger electron spectroscopy (
AES). The adsorption of oxygen at 300 K leads to formation of a thin f
ilm of amorphous aluminum oxide (a-Al2O3). After oxygen adsorption at
300 K and annealing of the oxygen-saturated surface to 1200 K, a well-
ordered thin theta-Al2O3 film is formed. After annealing of the oxygen
-saturated surface to 1400 K, an alpha-like Al2O3 oxide is grown. Even
at 20 K oxidation of the NiAl(001) surface is found. However, at high
er exposure (greater than or equal to 5 L) oxygen physisorbs and the E
EL spectrum exhibits characteristics of resonance scattering. The reso
nance energy for physisorbed oxygen on the amorphous Al oxide layers f
ormed at 20 K has a value of 7.0 eV. The frequency of O-O stretching v
ibration for physisorbed O-2 is 193 meV. The line shape of this mode i
s asymmetric with a pronounced tail on the high energy side. The asymm
etric line shape corresponds to multiple losses due to the overlap of
the O-O stretching mode with low frequency modes. After physisorption
of oxygen at 20 K on the alpha-like Al oxide layers, the resonance ene
rgy is shifted to 9.0 eV, a value close to that of oxygen in the gas p
hase.