THE ATOMIC-FORCE MICROSCOPE AS A NEAR-FIELD PROBE FOR ULTRASOUND

An atomic force microscope was modified such that vibrations in the MH z regime could be detected at the backside of the cantilever. The samp le was insonified by an ultrasonic transducer attached to it. Images w ith atomic resolution were obtained on a mica surface. The lowest reso nance frequency of cantilevers is usually several kHz. Nevertheless, u ltrasonic vibrations of high amplitude with frequencies of 1-15 MHz ca n be transmitted to cantilevers by exciting flexural vibrations. The p ropagation of the ultrasonic waves in the cantilever and their transmi ssion from the sample surface to the cantilever are discussed, taking into account non-linear effects.