APPLICATION OF NEURAL NETWORKS TO A SCANNING PROBE MICROSCOPY SYSTEM

Authors
HADJIISKI L LINNEMANN R STOPKA M OESTERSCHULZE E RANGELOW I KASSING R
Citation
L. Hadjiiski et al., APPLICATION OF NEURAL NETWORKS TO A SCANNING PROBE MICROSCOPY SYSTEM, Thin solid films, 264(2), 1995, pp. 291-297
Citations number
5
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
264
Issue
2
Year of publication
1995
Pages
291 - 297
Database
ISI
SICI code
0040-6090(1995)264:2<291:AONNTA>2.0.ZU;2-3
Abstract
An automatic adaptation procedure based on a neural network etalon mod el of a scanning tunnelling microscopy system is proposed in this pape r. The behaviour of the adaptive system applied to different sample su rfaces and scan ranges is investigated. An improvement of the system s tability and quality of the scan images is obtained.