HOLOGRAPHIC MEASUREMENT OF THE WAVE-ABERRATION OF AN ELECTRON-MICROSCOPE BY MEANS OF THE PHASES IN THE FOURIER SPECTRUM

Authors
FU Q LICHTE H
Citation
Q. Fu et H. Lichte, HOLOGRAPHIC MEASUREMENT OF THE WAVE-ABERRATION OF AN ELECTRON-MICROSCOPE BY MEANS OF THE PHASES IN THE FOURIER SPECTRUM, Journal of Microscopy, 179, 1995, pp. 112-118
Citations number
18
Categorie Soggetti
Microscopy
Journal title
Journal of Microscopy → ACNP
ISSN journal
00222720
Volume
179
Year of publication
1995
Part
2
Pages
112 - 118
Database
ISI
SICI code
0022-2720(1995)179:<112:HMOTWO>2.0.ZU;2-D
Abstract
The resolution limit achievable by holographic correction of the aberr ations of an electron microscope depends critically on the information available about the microscope parameters when the hologram was taken . The measuring technique based on symmetry relations of the phases in the Fourier spectrum of the reconstructed electron wave is outlined a nd experimentally tested.