POINT-DEFECT CONCENTRATION RELAXATION AND CREEP TRANSIENTS IN BINARY OXIDES

Citation
M. Jimenezmelendo et al., POINT-DEFECT CONCENTRATION RELAXATION AND CREEP TRANSIENTS IN BINARY OXIDES, Acta metallurgica et materialia, 43(10), 1995, pp. 3589-3604
Citations number
52
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
ISSN journal
09567151
Volume
43
Issue
10
Year of publication
1995
Pages
3589 - 3604
Database
ISI
SICI code
0956-7151(1995)43:10<3589:PCRACT>2.0.ZU;2-D
Abstract
In non-stoichiometric oxides (NiO, CoO, Cu-2 O...) two thermodynamic p arameters (temperature T and partial pression of oxygen P-O2) are nece ssary in order to fix the population of point defects. When one of the se two parameters (T or P-O2) is suddenly changed and a physical prope rty is continuously recorded, a ''transient'' can be observed due to t he diffusion of the point defects in order to reach the new thermodyna mic equilibrium population. Many works have been devoted to the majori ty point defects (non-stoichiometry). In this paper we present an over view about the high temperature transitory plastic deformation which i s related with the minority point defects.