T. Toyama et al., ELECTROLUMINESCENCE AND AVALANCHE MULTIPLICATION AT ELECTRIC-FIELD STRENGTH EXCEEDING 1 MV CM IN HYDROGENATED AMORPHOUS SIC ALLOY/, JPN J A P 1, 35(12A), 1996, pp. 5975-5979
High electric field effects in hydrogenated amorphous silicon carbide
alloy have been investigated employing a double insulating ac-driven e
lectroluminescent device structure. The carbon content was systematica
lly varied by changing the deposition conditions. Hot-electron-induced
electroluminescence and avalanche multiplication occurred at an elect
ric field of 1.4-2.3 MV/cm in amorphous silicon carbide as in hydrogen
ated amorphous silicon. From an analysis of the decay of the emission
spectrum in terms of the lucky-drift model, the electron mean free pat
h tends to be reduced with an increase in structural disorder due to c
arbon alloying.