CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOGCIRCUITS

Authors
DASILVA JM MATOS JS BELL IM TAYLOR GE
Citation
Jm. Dasilva et al., CROSS-CORRELATION BETWEEN I(DD) AND V(OUT) SIGNALS FOR TESTING ANALOGCIRCUITS, Electronics Letters, 31(19), 1995, pp. 1617-1618
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
Electronics Letters → ACNP
ISSN journal
00135194
Volume
31
Issue
19
Year of publication
1995
Pages
1617 - 1618
Database
ISI
SICI code
0013-5194(1995)31:19<1617:CBIAVS>2.0.ZU;2-M
Abstract
The cross-correlation between i(DD) and v(out) signals is addressed as a means for improving the testing of analogue circuits. Besides the h igher testing confidence provided by mixed i(DD)/v(out) monitoring, a single unified test operation is performed instead of two separate ope rations.