MODELING AND PERFORMANCE OF WAFER-FUSED RESONANT-CAVITY ENHANCED PHOTODETECTORS

Citation
Ih. Tan et al., MODELING AND PERFORMANCE OF WAFER-FUSED RESONANT-CAVITY ENHANCED PHOTODETECTORS, IEEE journal of quantum electronics, 31(10), 1995, pp. 1863-1875
Citations number
21
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
00189197
Volume
31
Issue
10
Year of publication
1995
Pages
1863 - 1875
Database
ISI
SICI code
0018-9197(1995)31:10<1863:MAPOWR>2.0.ZU;2-Q
Abstract
In this paper, we discuss wavelength tuning and its corresponding quan tum efficiency modulated by the standing wave effects in a resonant-ca vity enhanced (RCE) photodetectors. Specific design conditions are mad e for a thin In0.53Ga0.47As (900 Angstrom) photodetector wafer-fused t o a GaAs-AlAs quarter wavelength stacks (QWS). Analytic expressions fo r the calculation of resonant wavelength and standing wave effects are derived, using a hard mirror concept of fixed phase upon reflection, and are found to agree reasonably well with the exact numerical approa ch, using a transmission matrix method. We then experimentally demonst rate that wavelength tuning as large as 140 mn and its corresponding q uantum efficiency modulated by the standing wave effects are clearly o bserved in our wafer-fused photodetectors, consistent with the predict ions. The external quantum efficiency at 1.3 mu m wavelength and absor ption bandwidth for the wafer-fused RCE photodiodes integrated with an amorphous Si-SiO2 dielectric mirror are measured to be 94% and 14 mn, respectively. This technique allows the formation of multichannel pho todetectors with high quantum efficiency and small crosstalk, suitable for application to wavelength demultiplexing and high-speed, high-sen sitivity optical communication systems.