NEW METHOD TO DETERMINE INTRINSIC AND EXTRINSIC BASE-COLLECTOR CAPACITANCES OF HBTS USING THE MILLER EFFECT

Citation
Ys. Kim et al., NEW METHOD TO DETERMINE INTRINSIC AND EXTRINSIC BASE-COLLECTOR CAPACITANCES OF HBTS USING THE MILLER EFFECT, IEEE electron device letters, 16(10), 1995, pp. 445-447
Citations number
8
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
07413106
Volume
16
Issue
10
Year of publication
1995
Pages
445 - 447
Database
ISI
SICI code
0741-3106(1995)16:10<445:NMTDIA>2.0.ZU;2-P
Abstract
A new method to determine intrinsic and extrinsic base-collector capac itances of HBT's using the Miller effect is presented. The measured s- parameters of an HBT are calibrated and transformed into the ABCD-para meters. The fictitious input and output resistances are added to the H BT and total ABCD-parameters are calculated. The added output resistan ce degrades the frequency response of the overall network due to the M iller effect, which is used to extract intrinsic and extrinsic base-co llector capacitances. The advantage of this method is that it does not require any special test structure.