EXTREME-ULTRAVIOLET INTERFEROMETRY AT 15.5 NM USING MULTILAYER OPTICS

Citation
Lb. Dasilva et al., EXTREME-ULTRAVIOLET INTERFEROMETRY AT 15.5 NM USING MULTILAYER OPTICS, Applied optics, 34(28), 1995, pp. 6389-6392
Citations number
16
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
34
Issue
28
Year of publication
1995
Pages
6389 - 6392
Database
ISI
SICI code
0003-6935(1995)34:28<6389:EIA1NU>2.0.ZU;2-7
Abstract
The development of multilayer mirror technology capable of operating i n the range of 3-30 nm and the construction of thin membranes with exc ellent uniformity and strength have made it possible to design and imp lement a Mach-Zehnder interferometer operating at 15.5 nm. We have tes ted this interferometer by using a soft x-ray laser as a source, and w e show its use in probing high-density plasmas.