M. Testorf et S. Sinzinger, EVALUATION OF MICROLENS PROPERTIES IN THE PRESENCE OF HIGH SPHERICAL-ABERRATION, Applied optics, 34(28), 1995, pp. 6431-6437
Microlenses can be generated with various fabrication technologies. So
me of these technologies cause large spherical aberrations in the resu
lting microlenses. We describe an algorithm based on Rayleigh's quarte
r-wave criterion, which allows the evaluation of lens parameters for t
hose microlenses. Specifically, we investigate numerical aperture, foc
al length, and space-bandwidth product with respect to applications in
optical microsystems. We apply our algorithm to different types of mi
crolenses, three gradient-index lenses, and one surface-relief lens. T
he experimental results demonstrate that our algorithm provides a help
ful characterization method for microlenses with large aberrations.