QUALITY ASSESSMENT OF MGO SUBSTRATE MATERIALS FOR HIGH T-C SUPERCONDUCTOR THIN-FILMS USING CATHODOLUMINESCENCE MICROSCOPY

Citation
Pr. Fletcher et C. Leach, QUALITY ASSESSMENT OF MGO SUBSTRATE MATERIALS FOR HIGH T-C SUPERCONDUCTOR THIN-FILMS USING CATHODOLUMINESCENCE MICROSCOPY, Journal of the European Ceramic Society, 15(9), 1995, pp. 859-865
Citations number
25
Categorie Soggetti
Material Science, Ceramics
ISSN journal
09552219
Volume
15
Issue
9
Year of publication
1995
Pages
859 - 865
Database
ISI
SICI code
0955-2219(1995)15:9<859:QAOMSM>2.0.ZU;2-R
Abstract
Cathodoluminescence (CL) microscopy has been used to investigate the l uminescence response of MgO single crystal substrates intended for hig h T-c superconductor applications. Wavelength resolved CL spectra have been collected from both the surface and the bulk of the MgO single c rystals, under different preparatory treatments. It was found that ann ealing the MgO resulted in the reduction of luminescent surface defect states present in the as-received and ion milled samples and at sites of surface damage. The surface treatment given to MgO single crystals can significantly affect the electrical properties of high T-c superc onducting thin films deposited on them.