MUTATION OF CONSERVED NEGATIVELY CHARGED RESIDUES IN THE S2 AND S3 TRANSMEMBRANE SEGMENTS OF A MAMMALIAN K+ CHANNEL SELECTIVELY MODULATES CHANNEL GATING

Citation
R. Planellscases et al., MUTATION OF CONSERVED NEGATIVELY CHARGED RESIDUES IN THE S2 AND S3 TRANSMEMBRANE SEGMENTS OF A MAMMALIAN K+ CHANNEL SELECTIVELY MODULATES CHANNEL GATING, Proceedings of the National Academy of Sciences of the United Statesof America, 92(20), 1995, pp. 9422-9426
Citations number
34
Categorie Soggetti
Multidisciplinary Sciences
ISSN journal
00278424
Volume
92
Issue
20
Year of publication
1995
Pages
9422 - 9426
Database
ISI
SICI code
0027-8424(1995)92:20<9422:MOCNCR>2.0.ZU;2-J
Abstract
Voltage-gated channel proteins sense a change in the transmembrane ele ctric field and respond with a conformational change that allows ions to diffuse across the pore-forming structure, Site-specific mutagenesi s combined with electrophysiological analysis of expressed mutants in amphibian oocytes has previously established the S4 transmembrane segm ent as an element of the voltage sensor. Here, we show that mutations of conserved negatively charged residues in S2 and S3 of a brain K+ ch annel, thought of as counterchanges for the positively charged residue s in S4, selectively modulate channel gating without modifying the per meation properties, Mutations of Glu(235) in S2 that neutralize or rev erse charge increase the probability of channel opening and the appare nt gating valence. In contrast, replacements of Glu(272) by Arg or Thr (268) by Asp in S3 decrease the open probability and the apparent gati ng valence. Residue Glu(225) in S2 tolerated replacement only by acidi c residues, whereas Asp(258) in S3 was intolerant to any attempted cha nge, These results imply that S2 and S3 are unlikely to be involved in channel lining, yet, together with S4, may be additional components o f the voltage-sensing structure.