DOMAIN-STRUCTURES IN EPITAXIALLY GROWN COBALT THIN-FILMS

Following the epitaxial growth and characterization of single crystal c-axis oriented hcp cobalt thin films (with thicknesses in the range o f 200-600 Angstrom), we have investigated their micromagnetic domain p roperties by Lorentz electron microscopy (LEM). in particular we have used the differential phase contrast mode of LEM because this imaging technique allows a wide range of quantitative analysis to be carried o ut directly. The domain structures were studied in the as-grown, ac-de magnetized and remanent states. Large domains with regular magnetizati on ripple and cross ties were observed in the thinner films, whilst st ripe domains were seen in films with thicknesses greater than or equal to 400 Angstrom, Detailed analysis of the DPC images led to informati on pertaining to the domain wail width and its associated energy densi ty being attained.