T. Nakamura et al., PROCESS AND DEVICE TECHNOLOGIES FOR HIGH-SPEED SELF-ALIGNED BIPOLAR-TRANSISTORS, IEICE transactions on electronics, E78C(9), 1995, pp. 1154-1164
Recent high-speed bipolar technologies based on SICOS (Sidewall Base C
ontact Structure) transistors are reviewed. Bipolar device structures
that include polysilicon are key technologies for improving circuit ch
aracteristics. As the characteristics of the upward operated SICOS tra
nsistors are close to those of downward transistors, they can easily b
e applied in memory cells which have near-perfect soft-error-immunity.
Newly developed process technologies for making shallow base and emit
ter junctions to improve circuit performance are also reviewed. Finall
y, complementary bipolar technology for low-power and high-speed circu
its using pnp transistors, and a quasi-drift base transistor structure
suitable for below 0.1 mu m emitters are discussed.