METALLIC IMPURITIES DETERMINATION IN HIGH -PURITY INDIAN BY ATOMIC-EMISSION SPECTROMETRY IN INDUCTIVELY-COUPLED PLASMA

Citation
M. Ghineraru et M. Moldoveanu, METALLIC IMPURITIES DETERMINATION IN HIGH -PURITY INDIAN BY ATOMIC-EMISSION SPECTROMETRY IN INDUCTIVELY-COUPLED PLASMA, Revista de chimie, 46(8), 1995, pp. 769-772
Citations number
10
Categorie Soggetti
Chemistry
Journal title
ISSN journal
00347752
Volume
46
Issue
8
Year of publication
1995
Pages
769 - 772
Database
ISI
SICI code
0034-7752(1995)46:8<769:MIDIH->2.0.ZU;2-W
Abstract
The paper presents a rapid and efficient method for the determination of some impurities (i.e. Ag, Al, As, Cd, Cu, Fe, Ni, Pb, Sn, Te, Zn) i n the high purity metallic indium used in the synthesis of some A(III) B(V)-type semiconductor compounds. The determinations were performed by atomic emission spectrography in the inductively couple plasma (ICP -AES).