M. Ghineraru et M. Moldoveanu, METALLIC IMPURITIES DETERMINATION IN HIGH -PURITY INDIAN BY ATOMIC-EMISSION SPECTROMETRY IN INDUCTIVELY-COUPLED PLASMA, Revista de chimie, 46(8), 1995, pp. 769-772
The paper presents a rapid and efficient method for the determination
of some impurities (i.e. Ag, Al, As, Cd, Cu, Fe, Ni, Pb, Sn, Te, Zn) i
n the high purity metallic indium used in the synthesis of some A(III)
B(V)-type semiconductor compounds. The determinations were performed
by atomic emission spectrography in the inductively couple plasma (ICP
-AES).