M. Sagawa et al., HIGH-POWER HIGHLY-RELIABLE OPERATION OF 0.98-MU-M INGAAS-INGAP STRAIN-COMPENSATED SINGLE-QUANTUM-WELL LASERS WITH TENSILE-STRAINED INGAASP BARRIERS, IEEE journal of selected topics in quantum electronics, 1(2), 1995, pp. 189-195
We compared 0.98-mu m lasers with a strain-compensated active layer co
nsisting of a compressive InGaAs well. and tensile-strained InGaAsP ba
rriers with identical lasers that have a conventional active layer wit
h GaAs barriers. It was shown that the lasers with InGaAsP barriers ha
ve better temperature characteristics due to the larger energy gap dif
ference between a well and barriers. Because of the high characteristi
c temperature, 200-mW operation was obtained with the InGaAsP-barrier
laser even at 90 degrees C without any significant deterioration. We a
lso showed that the operation of the lasers with a strain-compensated
active layer was highly reliable, The degradation rate of these lasers
was four times smaller than that of the lasers with GaAs barriers due
to the better crystal quality in their active layer. The estimated li
fetime at 25 degrees C for the lasers with a strain-compensated active
layer was more than 170000 hours.