MEASUREMENT OF FLUID FILM THICKNESS ON CURVED SURFACES BY RAMAN-SPECTROSCOPY

Authors
HUTCHINSON EJ SHU D LAPLANT F BENAMOTZ D
Citation
Ej. Hutchinson et al., MEASUREMENT OF FLUID FILM THICKNESS ON CURVED SURFACES BY RAMAN-SPECTROSCOPY, Applied spectroscopy, 49(9), 1995, pp. 1275-1278
Citations number
17
Categorie Soggetti
Instument & Instrumentation",Spectroscopy
Journal title
Applied spectroscopy → ACNP
ISSN journal
00037028
Volume
49
Issue
9
Year of publication
1995
Pages
1275 - 1278
Database
ISI
SICI code
0003-7028(1995)49:9<1275:MOFFTO>2.0.ZU;2-9
Abstract
The Raman scattering intensity from a polyphenylether fluid film entra pped between a diamond window and a one-inch-diameter steel ball is fo und to correlate linearly with fluid film thickness over a 0.1 to 10 m u m thickness range. The calibration and precision of the technique, a s well as comparisons with other methods, are discussed.