CRYSTAL-STRUCTURE AND COMPOSITION OF POLYCRYSTALLINE CUINSE2

This work presents and analyses the X-ray diffraction data for the sem iconducting compound CuInSe2, synthesized by the vertical Bridgman met hod. The (Cu/In) ratio was varied to produce a stoichiometric CuInSe2 ingot. Structure factors (F-hkl) equations for the (hkl) reflections, which are available for the ternary chalcopyrite-structured semiconduc tors, were deduced analytically and have been used to calculate the re lative peak intensities for CuInSe2 diffraction planes. CuInSe2 thin f ilms were also prepared by flash evaporation of a stoichiometric CuInS e2 powder, onto different substrates. Structural characterization of t hese films was carried out by X-ray diffraction and scanning electron microscopy studies. The composition of the different samples has been determined by energy dispersive spectrometry. The results obtained ind icate the presence of the chalcopyrite phase and nearly stoichiometric compositions.