H. Ohya et al., PROPERTIES OF NEW INORGANIC MEMBRANES PREPARED BY METAL ALKOXIDE METHODS .1. A NEW PERMSELECTIVE CATION-EXCHANGE MEMBRANE-BASED ON SI TA OXIDES/, Journal of membrane science, 105(1-2), 1995, pp. 103-112
Inorganic silicon/tantalum membranes were prepared on a microporous al
umina substrate by dip coating with a solution containing Si(OC2H5)(4)
, C2H5OH, Ta(OC2H5)(5), CH3COOH in molar ratios of 1:6.8:X:0.068, thre
e types of membrane were prepared where X equalled 0, 0.02 and 0.06. T
he membrane coatings were polymerized by drying at 100 degrees C, and
the silica and mixed silicon/tantalum oxide membranes prepared by deco
mposition of these layers at temperatures between 150 and 300 degrees
C. After five coats the active layers were defect free and between 5 a
nd 15 mu m thick, depending upon the composition and temperature of pr
eparation. Pure silica membranes (X=0) showed no ion exchange properti
es. Si/Ta oxide membranes however had excellent ion exchange propertie
s. In the pH range 4-10 the Si/Ta oxide layers were purely cation exch
angers with no anion exchange function or uptake and cation exchange c
apacities 0.6 mequiv/g. Ion exchange capacities per unit area of membr
ane surface were in the range 8-10X10(-3) mequiv cm(-2). The static tr
ansport number for potassium in all the Si/Ta oxide membranes with fiv
e coating of alkoxide was 0.9 (for pure silica layers 0.5.) The ion ex
change character of these Si/Ta oxide layers is identical to that of p
ure silica, but the capacity was up to 10 times larger.