MOIRE DEFLECTOMETRY AS A METHOD FOR MEASURING WAVE ABERRATIONS

Moire deflectometry is a technique for measuring wave aberrations with high precision without using temporal coherent light The sensitivity is adjustable and so it can close the gap between white light and inte rferometric methods This is of major importance for measuring of optic al surfaces like aspheric lenses. Ln moire deflectometry usually two h inge patterns are generated, each providing a piece of information abo ut the measured wavefront. The interpretation of these fringe patterns is more complex than in the case of ordinary interferograms. Therefor e, in this paper, the properties of deflectograms, corresponding to va rious aberration types are analyzed numerically from computer generate d deflectograms Further, deflectograms of aberrations introduced by an aspherical surface are calculated. The ray matrix approach is propose d for calculation.