M. Osumi et al., ULTRAHIGH-RESOLUTION LOW-VOLTAGE SEM REVEALS ULTRASTRUCTURE OF THE GLUCAN NETWORK FORMATION FROM FISSION YEAST PROTOPLAST, Journal of Electron Microscopy, 44(4), 1995, pp. 198-206
The refined field emission SEM, S-900 LV which gives better resolution
especially at low voltages below 5 kV was developed for ultrahigh res
olution scanning electron microscopy. A visualization test at x 300,00
0 was made using a gold-evaporated magnetic tape, and the resolution w
as found to be about 1 nm at 2.5 kV. The ultrastructure of the cell wa
ll, especially the reverting glucan network, from the protoplast of Sc
hizosaccharomyces pombe was studied using this improved ultrahigh-reso
lution low-voltage SEM (UHR-LVSEM). The results with uncoated revertin
g protoplasts observed with this microscope revealed that the network
was originally formed as secreted particles scattered on the protoplas
t surface and these were subsequently stretched to microfibrils about
2 nm thick. The microfibrils were twisted around each other and joined
together so that they developed into 8-nm-thick fibrils, forming a ri
bbon-shaped network of glucans about 16-nm-thick which covered the ent
ire protoplast surface. The UHR-LVSEM images of reverting protoplasts
treated with glucanase confirmed that the particles scattered on the p
rotoplast surface in the initial stage of regeneration were glucan in
nature.