NEAR-FIELD OPTOELECTRONIC DETECTOR PROBES BASED ON STANDARD SCANNING FORCE CANTILEVERS

Near-field probes have been developed, based on standard, i.e., commer cially available, Si cantilever probes for scanning force microscopy ( SFM), which directly convert the optical near-field signal into an ele ctrical signal using Schottky contacts. With these optoelectronic prob es it is possible to realize very compact near-field microscopes. The probes are inserted into a SFM and measure the topography and the opti cal near-field signal simultaneously. The qualitative analysis of the light-sensitive areas of the probes and the detection of the optical n ear field is described. Finally, subwavelength resolution is demonstra ted when a polished glass surface is investigated. (C) 1995 American I nstitute of Physics.