EVALUATION OF HOT-ELECTRON COHERENT LENGTH USING WELL WIDTH DEPENDENCE OF THE RESONANCE CHARACTERISTICS OF RESONANT-TUNNELING DIODES

Citation
Yc. Kang et al., EVALUATION OF HOT-ELECTRON COHERENT LENGTH USING WELL WIDTH DEPENDENCE OF THE RESONANCE CHARACTERISTICS OF RESONANT-TUNNELING DIODES, JPN J A P 1, 34(8B), 1995, pp. 4417-4419
Citations number
11
Categorie Soggetti
Physics, Applied
Volume
34
Issue
8B
Year of publication
1995
Pages
4417 - 4419
Database
ISI
SICI code
Abstract
In order to evaluate the hot electron coherent length from the resonan ce characteristics of resonant tunneling diodes (RTDs), the dependence of the resonant level width on various broadening mechanisms is inves tigated. From the dependence of the resonant level width on the well w idth, it is shown that the individual contributions to resonant level broadening (phase relaxation and well width variation) can be analyzed separately. The resonant level widths were measured experimentally an d compared with theoretical results, and the coherent length was evalu ated to range from 80 to 120 nm at 4.2 K in GaInAs at hot electron ene rgies of 50 to 100 meV.