Yc. Kang et al., EVALUATION OF HOT-ELECTRON COHERENT LENGTH USING WELL WIDTH DEPENDENCE OF THE RESONANCE CHARACTERISTICS OF RESONANT-TUNNELING DIODES, JPN J A P 1, 34(8B), 1995, pp. 4417-4419
In order to evaluate the hot electron coherent length from the resonan
ce characteristics of resonant tunneling diodes (RTDs), the dependence
of the resonant level width on various broadening mechanisms is inves
tigated. From the dependence of the resonant level width on the well w
idth, it is shown that the individual contributions to resonant level
broadening (phase relaxation and well width variation) can be analyzed
separately. The resonant level widths were measured experimentally an
d compared with theoretical results, and the coherent length was evalu
ated to range from 80 to 120 nm at 4.2 K in GaInAs at hot electron ene
rgies of 50 to 100 meV.