CHARACTERIZATION OF INTERDIFFUSION IN SRTIO3 YBA2CU3O7-X MULTILAYERS BY IN-SITU AUGER-ELECTRON SPECTROSCOPY/

In situ deposition and surface characterization by Auger electron spec troscopy enabled precise surface composition analysis. The annealing t emperature dependence of the surface composition in SrTiO3(2.8 nm)/YBa 2Cu3O7-x and YBa2Cu3O7-x(2.7 nm)/SrTiO3 multilayers revealed the diffu sion of each of the constituent atoms. The interdiffusion is negligibl e below 600 degrees C. Ba atom diffusion into SrTiO3 was dominant in t he temperature range from 600 degrees C to 660 degrees C. The activati on energy was calculated to be 2.4 eV. Ti atom diffusion into YBa2Cu3O 7-x became distinctive above 660 degrees C. The activation energy of T i was 4.4 eV.