The mechanisms of silicon dissolution and pore formation during the fo
rmation of porous silicon layers (PSLs) are investigated in the HF-wat
er electrolyte solution. As HF concentration increases in the electrol
yte, the depth of pores increases while the pore diameter decreases. I
t is found that hydroxide ion (OH-) plays an apparently significant ro
le in the reaction with silicon. The formation of silicon oxide is obs
erved on the silicon surface during PSL formation. The dissolution mec
hanism of silicon is presented, based on spectroscopic analyses for th
e porous silicon surface. The area of initially formed silicon oxide o
n the silicon wafer surface determines the pore diameter. With increas
ing amount of OH- ions, or equivalently decreasing HF concentration, t
he thickness of the silicon walls between pores is reduced, revealing
the blue shift of photoluminescence energy due to the quantum size eff
ect.