Mj. Yang et al., ALXGA1-XAS SI (X=0-0.22) TANDEM SOLAR-CELLS GROWN BY METALORGANIC CHEMICAL-VAPOR-DEPOSITION/, JPN J A P 1, 33(12A), 1994, pp. 6605-6610
Studies of AlxGa1-xAs/Si (x=0-0.22) tandem solar cells have been carri
ed out by using metal organic chemical vapor deposition (MOCVD). The G
aAs/Si tandem solar cell consists of a GaAs top cell with the Al0.3Ga0
.7As buffer layer and a Si bottom cell with the n(+)-p-p(+) structure.
The theoretical analyses of the Si bottom cell are carried out for ta
ndem solar cell application. The suitable resistivity of the p-Si subs
trate for the Si bottom cell has been found to be 10 Omega . cm, which
corresponds to the experimental results. The active-area conversion e
fficiency of 19.5% (1sun, AM0) for the GaAs/Si tandem solar cell has b
een achieved in the three-terminal configuration. In the case of the A
lxGa1-xAs/Si tandem solar cell, x varies from 0.1 to 0.22. The crystal
line quality of the AlxGa1-xAs heteroepitaxial layer grown on Si is im
proved, using a high-temperature growth process (800 degrees C) and th
ermal cycle annealings (300-900 degrees C). The active-area conversion
efficiencies of 20.0% and 19.0% (1sun, AM0) for the Al0.15Ga0.85As/Si
tandem solar cell are obtained with four-terminal and two-terminal co
nfigurations, respectively.